Springer International Publishing AG, 2018. — 530 p. — (Springer Series in Surface Sciences 65). — ISBN: 3319756869; This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials,...
Springer, 2024. — 390 p. — ISBN 978-3-031-44233-9. . From a perspective of precision instrumentation, this book provides a guided tour to readers on exploring the inner workings of atomic force microscopy (AFM). Centered around AFM, a broad range of mechatronic system topics are covered including mechanics, sensors, actuators, transmission design, system identification, signal...
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