Нейтронография и нейтронные методы исследования

IOP Publishing Ltd, 2022. — 183 p. — ISBN 978-0-7503-4695-5. This book presents x-ray and neutron reflectometry techniques and how they can unravel interface structures and magnetism at the mesoscopic length scale in thin films and multilayers. The aim is to introduce the reader to neutron and x-ray reflectometry in general with an emphasis on polarized neutron reflectometry...