2nd ed. — Marcel Dekker, 1995. — 484 p. — ISBN: 0824795547.
This thoroughly revised and updated Second Edition of an incomparable hands-on reference covers every important aspect of x-ray spectrometry - from basic principles to the selection of instrument parameters and sample preparation.
This work covers important aspects of X-ray spectrometry, from basic principles to the selection of instrument parameters and sample preparation. This edition explicates the use of combined X-ray fluorescence and X-ray diffraction data, and features new applications in environmental studies, forensic science, archeometry and the analysis of metals and alloys, minerals and ore, ceramic materials, catalysts and trace metals.;This work is intended for spectroscopists, analytical chemists, materials scientists, experimental physicists, mineralogists, biologists, geologists and graduate-level students in these disciplines.