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Microwave Journal 2011 №06

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Microwave Journal 2011 №06
Contents:
David Vye, Microwave Journal Editor. A look into the inner workings of Skyworks and its evolution in the industry to become a major RFIC company.
K&L Microwave. A new series of high performance diplexers targets PIM testing.
Paul Pino, W. L. Gore & Associates, Inc. Discussion of the impact of materials on microwave cable performance and reliability.
R. Wolf, A. Joseph, P. Rabbeni and J. Dunn, IBM Microelectronics Division. Overview of how SOI technology solutions are becoming well positioned for FEM integration in advanced wireless communication systems.
Anthony Sweeney, Endwave Corp. Discussion of the business and performance drivers for the fundamental shift in the complexity of RF systems to MMICs.
Daniel Kehrer and Deepak Bachu, Infineon Technologies AG. Design challenges and solutions for receiver front-ends for global navigation satellite systems.
David Broadbent, National Instruments. Overview of four common sources of weakness encountered when using a vector network analysis and recommendations on how to best mitigate weak links from the measurements.
NXP Semiconductors. Recent developments of the SiGe:C BiCMOS process speeds migration from GaAs to Silicon.
Rosenberger Hochfrequenztechnik. Development of a versatile OSL(M) calibration kit that consists of components required to meet open-short-load and mismatch standards.
Microwave Vision Group, ORBIT/FR. Presentation of a self-contained compact range test system designed for testing smaller aperture antennas.
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