Sun Litao, Xu Tao, Zhang Ze (eds.) In-Situ Transmission Electron Microscopy

Springer, 2023. — 378 p. — ISBN 978-981-19-6844-0.This book focuses on in-situ transmission electron microscopy (TEM), an investigatory technique used to observe a sample’s response to a given stimulus (including electron irradiation, thermal excitation, mechanical force, optical excitation, electric and magnetic fields) at the nanoscale in real time. The book introduces readers to the technical strategy behind the in-situ technique and its developments. It reviews the research frontiers of using in-situ TEM in energy conversion and storage, catalysis, nanomaterials synthesis, nanoelectronics, etc. Furthermore, it discusses the future prospects for in-situ TEM. The book offers a valuable guide for all undergraduate and graduate students who are interested in TEM characterization technology. It also serves as a reference source on cutting-edge in-situ techniques for researchers and engineers.Introduction to In-Situ Transmission Electron Microscopy
Electron Beam Irradiation Effects and In-Situ Irradiation of Nanomaterials
In-Situ Nanomechanical TEM
In-Situ Heating TEM
In-Situ Biasing TEM
In-Situ Optical TEM
Magnetism In-Situ TEM
In-Situ Liquid Cell TEM
In-Situ Gas Transmission Electron Microscopy
4D Ultrafast TEM