2nd Edition. — Wiley, 2004. — 471 p. — ISBN: 3527405658.
This book/CD package provides a reference on electron energy loss spectrometry (EELS) with the transmission electron microscope, an established technique for chemical and structural analysis of thin specimens in a transmission electron microscope. Describing the issues of instrumentation, data acquisition, and data analysis, the authors apply this technique to several classes of materials, namely ceramics, metals, polymers, minerals, semiconductors, and magnetic materials. The accompanying CD-ROM consists of a compendium of experimental spectra.
Experimental Techniques and Instrumentation
EELS Quantitative Analysis
Energy Loss Fine Structure
Energy Filtered Diffraction
Elemental Mapping Using Energy Filtered Imaging
Probing Materials Chemistry Using ELNES
Application to Ceramics, Catalysts and Transition Metal Oxides
EELS of the Electronic Structure and Microstructure of Metals
Electron Energy Loss Studies in Semiconductors
Electron Energy Loss Spectroscopy of Magnetic Materials
Electron Energy Loss Spectroscopy of Polymers