Breitenstein O., Warta W., Schubert M.C. Lock-in Thermography

3rd Edition. — Springer, 2019. — 339 p. — (Springer Series in Advanced Microelectronics 10). — ISBN: 3319998242.This is the first book on lock-in thermography, an analytical method applied to the diagnosis of microelectronic devices. This useful introduction and guide reviews various experimental approaches to lock-in thermography, with special emphasis on the lock-in IR thermography developed by the authors themselves.Physical and Technical Basics
Experimental Technique
Theory
Measurement Strategies
Typical Applications
Summary and Outlook
Appendix: Thermal and IR Properties of Selected Materials