Reifenberger R.G. Fundamentals of Atomic Force Microscopy: Part I: Foundations

World Scientific Publishing Co. Pte. Ltd., 2016. — 341 p. — (Lessons from Nanoscience: A Lecture Note Series. Volume 4) — ISBN: 9814630357The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution. The intelligent use of this instrument requires knowledge from many distinct fields of study. These lecture notes aim to provide advanced undergraduates and beginning graduates in all fields of science and engineering with the required knowledge to sensibly use an AFM. Relevant background material is often reviewed in depth and summarized in a pedagogical, self-paced style to provide a fundamental understanding of the scientific principles underlying the use and operation of an AFM.Introduction to Scanning Probe Microscopy
The Force between Molecules
Simple Models for Molecule–Molecule Interactions
Van der Waals Interactions between Macroscopic Objects
When the Tip Contacts the Substrate: Contact Mechanics
Quasi-Static Cantilever Mechanics
AFM System Components
Contact Mode AFM
Experimental Calibrations
Computer-Aided AFM Simulations