Morita S., Wiesendanger R., Meyer E. (Eds.) Noncontact Atomic Force Microscopy. Volume 1

Springer-Verlag, Berlin, Heidelberg, 2002. — 447 p. — (NanoScience and Technology) — ISBN: 9783642627729Atomic force microscopy (AFM) was invented in 1986 by G. Binnig and coworkers at Stanford University. Since then it has successfully achieved many outstanding results on micro- and nanoscales and even on atomic and molecular scales by simple contact measurements, although contact AFM cannot achieve true atomic resolution in a stable manner.
In 1995 Giessibl, and Kitamura and Iwatsuki succeeded in obtaining a 1l01lcontact AFM (NC-AFJ\I) image of the Si(1l1)7x7 surface with atomic resolution in UHV at room temperature (RT) using a frequency modulation (FM) detection method. In the same year, Ueyama et al. obtained an NC-AFM image of an atomic vacancy on an InP(llO) cleaved surface and then Sugawara et al. observed defect motion of an atomic vacancy on InP(llO).
Hence, using the FM detection method, NC-AFM in UHV clearly demonstrated the possibility of obtaining true atomic resolution under the attractive regime at RT. This book, presenting recent progress in the NC-AFM field, is the first book to introduce and explain the principles, imaging mechanisms, performance, functions, applications and theory of NC-AFM.Principle of NC-AFM
Semiconductor Surfaces
Bias Dependence of NC-AFM Images and Tunneling Current Variations on Semiconductor Surfaces
Alkali Halides
Atomic Resolution Imaging on Fluorides
Atomically Resolved Imaging of a NiO(001) Surface
Atomic Structure, Order and Disorder on High Temperature Reconstructed a-Al2O3(0001)
NC-AFM Imaging of Surface Reconstructions and Metal Growth on Oxides
Atoms and Molecules on TiO2 (110) and CeO2(111) Surfaces
NC-AFM Imaging of Adsorbed Molecules
Organic Molecular Films
Single-Molecule Analysis
Low-Temperature Measurements: Principles, Instrumentation, and Application
Theory of Non-Contact Atomic Force Microscopy
Chemical Interaction in NC-AFM on Semiconductor Surfaces
Contrast Mechanisms on Insulating Surfaces
Analysis of Microscopy and Spectroscopy Experiments
Theory of Energy Dissipation into Surface Vibrations
Measurement of Dissipation Induced by Tip-Sample Interactions