Morita S., Giessibl F.J., Wiesendanger R. (Eds.) Noncontact Atomic Force Microscopy. Volume 2

Springer-Verlag, Berlin, Heidelberg, 2009. — 409 p. — (NanoScience andTechnology) — ISBN: 9783642014949Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology.Method for Precise Force Measurements
Force Spectroscopy on Semiconductor Surfaces
Tip–Sample Interactions as a Function of Distance on Insulating Surfaces
Force Field Spectroscopy in Three Dimensions
Principles and Applications of the qPlus Sensor
Study of Thin Oxide Films with NC-AFM: Atomically Resolved Imaging and Beyond
Atom Manipulation on Semiconductor Surfaces
Atomic Manipulation on Metal Surfaces
Atomic Manipulation on an Insulator Surface
Basic Mechanisms for Single Atom Manipulation in Semiconductor Systems with the FM-AFM
Multi-Scale Modelling of NC-AFM Imaging and Manipulation at Insulating Surfaces
Magnetic Exchange Force Microscopy
First-Principles Simulation of Magnetic Exchange Force Microscopy on Fe/W(001)
Frequency Modulation Atomic Force Microscopy in Liquids
Biological Applications of FM-AFM in Liquid Environment
High-Frequency Low Amplitude Atomic Force Microscopy
Cantilever Dynamics and Nonlinear Effects in Atomic Force Microscopy