Morita S., Giessibl F.J., Meyer E., Wiesendanger R. (Eds.) Noncontact Atomic Force Microscopy. Volume 3

Springer International Publishing, Switzerland, 2015. — 539 p. — (NanoScience and Technology) —
ISBN: 9783319155876This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that have been obtained with atomic resolution after the publication of volume 2: (1) Pauli repulsive force imaging of molecular structure, (2) Applications of force spectroscopy and force mapping with atomic resolution, (3) Applications of tuning forks, (4) Applications of atomic/molecular manipulation, (5) Applications of magnetic exchange force microscopy, (6) Applications of atomic and molecular imaging in liquids, (7) Applications of combined AFM/STM with atomic resolution, and (8) New technologies in dynamic force microscopy. These results and technologies are now expanding the capacity of the NC-AFM with imaging functions on an atomic scale toward making them characterization and manipulation tools of individual atoms/molecules and nanostructures, with outstanding capability at the level of molecular, atomic, and subatomic resolution. Since the publication of vol. 2 of the book Noncontact Atomic Force Microscopy in 2009 the noncontact atomic force microscope, which can image even insulators with atomic resolution, has achieved remarkable progress. The NC-AFM is now becoming crucial for nanoscience and nanotechnology.3D Force Field Spectroscopy
Simultaneous nc-AFM/STM Measurements with Atomic Resolution
Manipulation and Spectroscopy Using AFM/STM at Room Temperature
The Phantom Force
Non-contact Friction
Magnetic Exchange Force Spectroscopy
Revealing Subsurface Vibrational Modes by Atomic-Resolution Damping Force Spectroscopy
Self-assembly of Organic Molecules on Insulating Surfaces
Atomic-Scale Contrast Formation in AFM Images on Molecular Systems
Single Molecule Force Spectroscopy
Atomic Resolution on Molecules with Functionalized Tips
Mechanochemistry at Silicon Surfaces
Scanning Tunnelling Microscopy with Single Molecule Force Sensors
Nanostructured Surfaces of Doped Alkali Halides
The Atomic Structure of Two-Dimensional Silica
Imaging Molecules on Bulk Insulators Using Metallic Tips
Simulating Solid-Liquid Interfaces in Atomic Force Microscopy
Recent Progress in Frequency Modulation Atomic Force Microscopy in Liquids
Advanced Instrumentation of Frequency Modulation AFM for Subnanometer-Scale 2D/3D Measurements at Solid-Liquid Interfaces
Electrochemical Applications of Frequency Modulation Atomic Force Microscopy
High-Speed Atomic Force Microscopy