Kalinin S.V., Gruverman A. (Eds.) Scanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale (2 Volume Set)

Springer Science+Business Media, LLC, 2007. — 1002 p. — ISBN: 0387286675Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques ranging from fundamental physical studies to device characterization, failure analysis, and nanofabrication. Volume 1 focuses on the technical aspects of SPM methods ranging from scanning tunneling potentiometry to electrochemical SPM, and addresses the fundamental physical phenomena underlying the SPM imaging mechanism. Volume 2 concentrates on the practical aspects of SPM characterization of a wide range of materials, including semiconductors, ferroelectrics, dielectrics, polymers, carbon nanotubes, and biomolecules, as well as on SPM-based approaches to nanofabrication and nanolithography.
Contents to Volume 1
SPM Techniques for Electrical Characterization
Scanning Tunneling Potentiometry: The Power of STM applied to Electrical Transport
Probing Semiconductor Technology and Devices with Scanning Spreading Resistance Microscopy
Scanning Capacitance Microscopy for Electrical Characterization of Semiconductors and Dielectrics
Principles of Kelvin Probe Force Microscopy
Frequency-Dependent Transport Imaging by Scanning Probe Microscopy
Review of Ferroelectric Domain Imaging by Piezoresponse Force Microscopy
Principles of Near-Field Microwave Microscopy
Electromagnetic Singularities and Resonances in Near-Field Optical Probes
Electrochemical SPM: Fundamentals and Applications
Near-Field High-Frequency Probing
Electrical and Electromechanical lmaging at the Limits
Scanning Probe Microscopy on Low-Dimensional Electron Systems in III-V Semiconductors
Spin-Polarized Scanning Tunneling Microscopy
Scanning Probe Measurements of Electron Transport in Molecules
Scanning Probe Microscopy of Individual Carbon Nanotube Quantum Devices
Conductance AFM Measurements of Transport Through Nanotubes and Nanotube Networks
Theory of Scanning Probe Microscopy
Multi-Probe Scanning Tunneling Microscopy
Dynamic Force Microscopy and Spectroscopy in Vacuum
Scanning Tunneling Microscopy and Spectroscopy of Manganites
Contents to Volume 2
Electrical SPM Characterization of Materials and Devices
Scanning Voltage Microscopy: Investigating the Inner Workings of Optoelectronic Devices
Electrical Scanning Probe Microscopy of Biomolecules on Surfaces and at Interfaces
Electromechanical Behavior in Biological Systems at the Nanoscale
Scanning Capacitance Microscopy: Applications in Failure Analysis, Active Device Imaging, and Radiation Effects
Kelvin Probe Force Microscopy of Semiconductors
Nanoscale Characterization of Electronic and Electrical Properties of IIl-Nitrides by Scanning Probe Microscopy
Electron Flow Through Molecular Structures
Electrical Characterization of Perovskite Nanostructures by SPM
SPM Measurements of Electric Properties of Organic Molecules
High-Sensitivity Electric Force Microscopy of Organic Electronic Materials and Devices
Electrical Nanofabrication
Electrical SPM-Based Nanofabrication Techniques
Fundamental Science and Lithographic Applications of Scanning Probe Oxidation
UHV-STM Nanofabrication on Silicon
Ferroelectric Lithography
Patterned Self-Assembled Monolayers via Scanning Probe Lithography
Resistive Probe Storage: Read/W rite Mechanism