Kalinin S.V., Gruverman A. (Ed.) Scanning Probe Microscopy of Functional Materials: Nanoscale Imaging and Spectroscopy

Springer Science+Business Media, LLC, 2011. – 575 p. – ISBN: 144196567XThe goal of this book is to provide a general overview of the rapidly developing field of novel scanning probe microscopy (SPM) techniques for characterization of a wide range of functional materials, including complex oxides, biopolymers, and semiconductors. Many recent advances in condensed matter physics and materials science, including transport mechanisms in carbon nanostructures and the role of disorder on high temperature superconductivity, would have been impossible without SPM. The unique aspect of SPM is its potential for imaging functional properties of materials as opposed to structural characterization by electron microscopy. Examples include electrical transport and magnetic, optical, and electromechanical properties. By bringing together critical reviews by leading researchers on the application of SPM to to the nanoscale characterization of functional materials properties, this book provides insight into fundamental and technological advances and future trends in key areas of nanoscience and nanotechnology.Spectroscopic SPM at the Resolution Limits
Excitation and Mechanisms of Single Molecule Reactions in Scanning Tunneling Microscopy
High-Resolution Architecture and Structural Dynamics of Microbial and Cellular Systems: Insights from in Vitro Atomic Force Microscopy
Dynamic Spectroscopic SPM
Dynamic Force Microscopy and Spectroscopy in Ambient Conditions: Theory and Applications
Measuring Mechanical Properties on the Nanoscale with Contact Resonance Force Microscopy Methods
Multi-Frequency Atomic Force Microscopy
Dynamic Nanomechanical Characterization Using Multiple-Frequency Method
Thermal Characterization by SPM
Toward Nanoscale Chemical Imaging: The Intersection of Scanning Probe Microscopy and Mass Spectrometry
Dynamic SPM Methods for Local Analysis of Thermo-Mechanical Properties
Electrical and Electromechanical SPM
Advancing Characterization of Materials with Atomic Force Microscopy-Based Electric Techniques
Quantitative Piezoresponse Force Microscopy: Calibrated Experiments, Analytical Theory and Finite Element Modeling
High-Speed Piezo Force Microscopy: Novel Observations of Ferroelectric Domain Poling, Nucleation, and Growth
Polar Structures in Relaxors by Piezoresponse Force Microscopy
Symmetries in Piezoresponse Force Microscopy
Novel SPM Concepts
New Capabilities at the Interface of X-Rays and Scanning Tunneling Microscopy
Scanning Ion Conductance Microscopy
Combined Voltage-Clamp and Atomic Force Microscope for the Study of Membrane Electromechanics
Dynamic and Spectroscopic Modes and Multivariate Data Analysis in Piezoresponse Force Microscopy
Polarization Behavior in Thin Film Ferroelectric Capacitors at the Nanoscale