Springer-Verlag, Berlin, Heidelberg, 2008. – 536 p. – ISBN: 3540745602
This volume describes modern developments in reflective, refractive and diffractive optics for short wavelength radiation. It also covers recent theoretical approaches to modelling and ray-tracing the x-ray and neutron optical systems.
X-Ray and Neutron Optical Systems
Theoretical Approaches and CalculationsThe BESSY Raytrace Program RAY
Neutron Beam Phase Space Mapping
Raytrace of Neutron Optical Systems with RESTRAX
Wavefront Propagation
Theoretical Analysis of X-Ray Waveguides
Focusing Optics for Neutrons
Volume Effects in Zone Plates
Nano-Optics MetrologySlope Error and Surface Roughness
The Long Trace Profilers
The Nanometer Optical Component Measuring Machine
Shape Optimization of High Performance X-Ray Optics
Measurement of Groove Density of Diffraction Gratings
The COST P7 Round Robin for Slope Measuring Profilers
Hartmann and Shack–Hartmann Wavefront Sensors for Sub-nanometric Metrology
Extraction of Multilayer Coating Parameters from X-Ray Reflectivity Data
Refection/Refraction OpticsHard X-Ray Microoptics
Capillary Optics for X-Rays
Reflective Optical Arrays
Reflective Optical Structures and Imaging Detector Systems
CLESSIDRA: Focusing Hard X-Rays Efficiently with Small Prism Arrays
Multilayer Optics DevelopmentsNeutron Supermirror Development
Stress Reduction in Multilayers Used for X-Ray and Neutron Optics
Multilayers with Ultra-Short Periods
Specially Designed Multilayers
Diffraction OpticsDiffractive-Refractive Optics: X-ray Crystal Monochromators with Profiled Diffracting Surfaces
Neutron Multiple Reflections Excited in Cylindrically Bent Perfect Crystals and Their Possible use for High-Resolution Neutron Scattering
Volume Modulated Diffraction X-Ray Optics
High Resolution 1D and 2D Crystal Optics Based on Asymmetric Diffractors
Thermal Effects under Synchrotron Radiation Power Absorption