ASTM F 76-86. Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors

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In: Annual Book of ASTM Standards vol. 10.04 (Electronics I), West Honshohoken, PA: ASTM Intl., 2001. - 13 p. - Reapproved 1996.
These test methods cover two procedures differing most substancially in test specimen requirements, especially their shape:
- Method A, van der Pau,
- Method B, Parallelepiped, or Bridge-Type.