ASTM F 43-99. Test Methods for Resistivity of Semiconductor Materials

In: Annual Book of ASTM Standards vol. 10.04 (Electronics I), West Honshohoken, PA: ASTM Intl., 2001. - 6 p.
These test methods cover two procedures:
- Method A, Two-Probe,
- Method B, Four-Probe.
These procedures apply directly to both silicon and germanium. Application to other semiconductors may require the use of different probe material and probe attachments.