ASTM E 1161 - 95. Standard Test Method for Radiologic Examination of Semiconductors and Electronic Components

American Society for Testing and Materials (ASTM). 1995, 3 pages.
This test method provides a standard procedure for nondestructive radiographic examination of semiconductor devices, electronic components, and the materials used for construction of these items. This test method covers the radiographic testing of these items for possible defective
conditions such as extraneous material within the sealed case, improper internal connections, voids in materials used for element mounting, or the sealing glass, or physical damage