Leng Y. Materials Characterization: Introduction to Microscopic and Spectroscopic Methods

Wiley-VCH, 2013. - 376 p.This book covers state-of-the-art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical analysis, are included. Widely used techniques, such as metallography (light microscopy), X-ray diffraction, transmission and scanning electron microscopy, are described. In addition, the book introduces advanced techniques, including scanning probe microscopy. The second half of the book accordingly presents techniques such as X-ray energy dispersive spectroscopy (commonly equipped in the scanning electron microscope), fluorescence X-ray spectroscopy, and popular surface analysis techniques (XPS and SIMS). Finally, vibrational spectroscopy (FTIR and Raman) and thermal analysis are also covered.Light Microscopy
X-Ray Diffraction Methods
Transmission Electron Microscopy
Scanning Electron Microscopy
Scanning Probe Microscopy
X-Ray Spectroscopy for Elemental Analysis
Electron Spectroscopy for Surface Analysis
Secondary Ion Mass Spectrometry for Surface Analysis
Vibrational Spectroscopy for Molecular Analysis
Thermal Analysis