Bowen W.R., Hilal N. (Eds.) Atomic Force Microscopy in Process Engineering: An Introduction to AFM for Improved Processes and Products

Butterworth-Heinemann, Elsevier, 2009, 283 pages, ISBN: 1856175170Atomic force microscopy (AFM) is a surface imaging technique that can be applied at sub-nanometre resolution in liquids and gases. The same instrumentation can also be used to quantify directly the forces of interfacial interaction in such environments and is therefore a critical tool for process engineers and scientists, where AFM investigations are leading directly to improved processes and products.This is the first book to bring together both the basic theory and proven process engineering practice of AFM, and to present them in a way that is accessible and valuable to both practising engineers, those who are improving their AFM skills and knowledge, and to researchers who are developing new products and solutions using AFM.The book takes a rigorous but practical approach to ensure that it is also directly applicable to practical process engineering problems. Fundamentals of the techniques are concisely described and specific benefits for process engineering clearly defined and illustrated. Coverage of applications of AFM to important areas of process engineering is comprehensive. Each of the chapter authors are recognized authorities on their subject.The only book dealing with the theory and practical applications of atomic force microscopy in process engineering
Strikes the correct balance between developing an understanding of AFM principles and providing best-practice guidance and experience on using AFM in practice for process and product improvement
Written by the engineers and scientists who pioneered this fieldBasic Principles of Atomic Force Microscopy
Measurement of Particle and Surface Interactions Using Force Microscopy
Quantification of Particle–Bubble Interactions Using Atomic Force Microscopy
Investigating Membranes and Membrane Processes with Atomic Force Microscopy
AFM and Development of (Bio)Fouling-Resistant Membranes
Nanoscale Analysis of Pharmaceuticals by Scanning Probe Microscopy
Micro/Nanoengineering and AFM for Cellular Sensing
Atomic Force Microscopy and Polymers on Surfaces
Application of Atomic Force Microscopy for the Study of Tensile and Microrheological Properties of Fluids
Future Prospects