Kaupp G. Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching. Application to Rough and Natural Surfaces

Springer-Verlag Berlin Heidelberg, 2006- P.296
The series NanoScience and Technology is focused on the fascinating nano-world, mesoscopic
physics, analysis with atomic resolution, nano and quantum-effect devices, nanomechanics
and atomic-scale processes. All the basic aspects and technology-oriented developments
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students.Atomic Force Microscopy
Scanning Near-Field Optical Microscopy
Nanoindentation
Nanoscratching